ZEISS is an internationally leading technology enterprise operating in the fields of optics and optoelectronics. Thanks to our strong ties to our global customer community, we are delighted to partner with ZEISS to make this great solution become even more widespread – a clear win-win situation.” Through this partnership with ZEISS, we continue this tradition with DeepFocus 1, utilizing the best technology available for real-time extended depth of focus. Mark Curtis, Managing Director at Vision Engineering, agrees: “We at Vision Engineering have been offering our customers state-of-the-art solutions for their measuring and inspection tasks for a long time. With its extensive experience, our partner Vision Engineering embeds this in an attractive package that I am sure will convince a lot of new customers.” Robert Zarnetta, Head of Business Unit Industrial Microscopy Solutions at ZEISS, is happy about the collaboration: “With the unique MALS™ Technology in the Visioner 1 digital microscope, we offer customers a way to greatly increase their productivity and efficiency during their quality assurance and optical inspection. Another part of the DeepFocus 1 package from ZEISS’ side is the powerful ZEN core imaging software suite.ĭr. The result is a more efficient failure analysis and quality control process with fast and accurate results. This allows optical inspection for height differences of up to 69mm with an up to 100 times greater depth of focus than that of a conventional microscope, which not only makes the inspection task easier, but also much quicker, saving significant amounts of time. The key to this is the namesake system with an array of micro-mirrors that can generate “virtual” lenses with distinctly different curvatures and thus focus planes, by changing the orientation of each individual micro-mirror in an orchestrated way. However, thanks to its unique MALS™ Technology, ZEISS Visioner 1 enables the user to see the sample completely in focus in real-time, without the need to Z-stack and post-process a series of images. Extensive refocusing to obtain an extended depth of field, or post-processing, is a solution to this problem, but can be time-consuming and complex. As a result, only a small area of the sample is in focus, which can lead to features being overlooked and the inspection being incomplete as a result. Conventional inspection systems are challenged by a shallow depth of field, especially at high magnification.
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